Showing results 56 to 75 of 81
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| Issue Date | Title | Author(s) |
 | 2005 | Packaging of optical diffraction strain sensor | Duan, Lin. |
 | 2013 | Phase aberration compensation in digital holographic microscopy based on principal component analysis | Qu, Weijuan; Asundi, Anand Krishna; Zuo, Chao; Chen, Qian |
| 2007 | Phase measurement errors due to holographic interferograms compression | Soraghan, John J.; Darakis, Emmanouil; Singh, Vijay Raj; Asundi, Anand Krishna |
| | 2012 | Phase retrieval from reflective fringe patterns of double-sided transparent objects | Huang, Lei; Asundi, Anand Krishna |
| 2012 | Phase shift reflectometry for sub-surface defect detection | Asundi, Anand Krishna; Lei, Huang; Teoh, Eden Kang Min; Sreemathy, Parthasarathy; May, Watt Sook |
| 2015 | Phase shift reflectometry for wafer inspection | Peng, Kuang; Cao, Yiping; Li, Hongru; Sun, Jianfei; Bourgade, Thomas; Asundi, Anand Krishna |
| 2008 | Processing of digital holograms for size measurements of microparticlese | Naughton, Thomas J.; Darakis, Emmanouil; Khanam, Taslima; Rajendran, Arvind; Kariwala, Vinay; Asundi, Anand Krishna |
| 2013 | Quantitative phase from defocused intensity by image deconvolution | Zuo, Chao; Chen, Qian; Asundi, Anand Krishna |
| 2011 | Rapid defect detections of bonded wafer using near infrared polariscope | Asundi, Anand Krishna; Ng, Chi Seng |
| 2000 | Residual stress measurement in composite materials | Liu, Yu. |
| 2000 | Residual stress measurement in composite materials | Asundi, Anand Krishna; Chai, Gin Boay; Wong, Brian Stephen; Gan, W. S. |
| 2013 | Single-shot quantitative phase microscopy with the transport-of-intensity equation | Zuo, Chao; Chen, Qian; Qu, Weijuan; Asundi, Anand Krishna |
| 2017 | Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystal | Guan, Lichao; Ding, Jiexiong; Du, Li; Adhikari, Achyut; Asundi, Anand Krishna |
| | 2011 | Studies on aperture synthesis in digital Fresnel holography | Hao, Yan; Asundi, Anand Krishna |
| 2003 | Studies on digital holography and interferometric application in micromeasurement | Xu, Lei. |
| 2002 | Studies on diode-pumped solid-state vanadate lasers | Peng, Xiaoyuan. |
| 2003 | Study on the application of multiple line laser to perform BGA package ball inspection | Tan, Chun Seng. |
| 2008 | Surface profile measurement using a laser displacement sensor | Talukdar, Amitava |
| 2019 | Temporal phase unwrapping using deep learning | Yin, Wei; Chen, Qian; Feng, Shijie; Tao, Tianyang; Huang, Lei; Trusiak, Maciej; Asundi, Anand Krishna; Zuo, Chao |
| 2017 | Transmittance measurement using scanning LED | Rosmin Elsa Mohan; Lau, Gih-Keong; Asundi, Anand Krishna; Ping, Yao |
