Browsing by Author Asundi, Anand Krishna

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Showing results 66 to 83 of 83 < previous 
Issue DateTitleAuthor(s)
2011Rapid defect detections of bonded wafer using near infrared polariscopeAsundi, Anand Krishna; Ng, Chi Seng
2000Residual stress measurement in composite materialsAsundi, Anand Krishna; Chai, Gin Boay; Wong, Brian Stephen; Gan, W. S.
2000Residual stress measurement in composite materialsLiu, Yu.
2013Single-shot quantitative phase microscopy with the transport-of-intensity equationZuo, Chao; Chen, Qian; Qu, Weijuan; Asundi, Anand Krishna
2017Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystalGuan, Lichao; Ding, Jiexiong; Du, Li; Adhikari, Achyut; Asundi, Anand Krishna
 2011Studies on aperture synthesis in digital Fresnel holographyHao, Yan; Asundi, Anand Krishna
2003Studies on digital holography and interferometric application in micromeasurementXu, Lei.
2002Studies on diode-pumped solid-state vanadate lasersPeng, Xiaoyuan.
2003Study on the application of multiple line laser to perform BGA package ball inspectionTan, Chun Seng.
2008Surface profile measurement using a laser displacement sensorTalukdar, Amitava
2019Temporal phase unwrapping using deep learningYin, Wei; Chen, Qian; Feng, Shijie; Tao, Tianyang; Huang, Lei; Trusiak, Maciej; Asundi, Anand Krishna; Zuo, Chao
2017Transmittance measurement using scanning LEDRosmin Elsa Mohan; Lau, Gih-Keong; Asundi, Anand Krishna; Ping, Yao
2013Transport-of-intensity phase imaging using Savitzky-Golay differentiation filter : theory and applicationsZuo, Chao; Chen, Qian; Yu, Yingjie; Asundi, Anand Krishna
2010Tunable micro-optofluidic prism based on liquid-core liquid-cladding configurationSong, Chaolong; Nguyen, Nam-Trun; Asundi, Anand Krishna; Tan, Say-Hwa
2011Tunable optofluidic aperture configured by a liquid-core/liquid-cladding structureSong, Chaolong; Nguyen, Nam-Trung; Asundi, Anand Krishna; Low, Cassandra Lee-Ngo
2010A tuneable micro-optofluidic biconvex lens with mathematically predictable focal lengthSong, Chaolong; Nguyen, Nam-Trung; Tan, Say-Hwa; Asundi, Anand Krishna
2002Unified digital photoelasticity : a tool for stress analysisLiu, Tong.
2011Whole field curvature and residual stress determination of silicon wafers by reflectometryNg, Chi Seng; Asundi, Anand Krishna