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Asundi, Anand Krishna
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Showing results 69 to 83 of 83
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Issue Date
Title
Author(s)
2013
Single-shot quantitative phase microscopy with the transport-of-intensity equation
Zuo, Chao
;
Chen, Qian
;
Qu, Weijuan
;
Asundi, Anand Krishna
2017
Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystal
Guan, Lichao
;
Ding, Jiexiong
;
Du, Li
;
Adhikari, Achyut
;
Asundi, Anand Krishna
2011
Studies on aperture synthesis in digital Fresnel holography
Hao, Yan
;
Asundi, Anand Krishna
2003
Studies on digital holography and interferometric application in micromeasurement
Xu, Lei.
2002
Studies on diode-pumped solid-state vanadate lasers
Peng, Xiaoyuan.
2003
Study on the application of multiple line laser to perform BGA package ball inspection
Tan, Chun Seng.
2008
Surface profile measurement using a laser displacement sensor
Talukdar, Amitava
2019
Temporal phase unwrapping using deep learning
Yin, Wei
;
Chen, Qian
;
Feng, Shijie
;
Tao, Tianyang
;
Huang, Lei
;
Trusiak, Maciej
;
Asundi, Anand Krishna
;
Zuo, Chao
2017
Transmittance measurement using scanning LED
Rosmin Elsa Mohan
;
Lau, Gih-Keong
;
Asundi, Anand Krishna
;
Ping, Yao
2013
Transport-of-intensity phase imaging using Savitzky-Golay differentiation filter : theory and applications
Zuo, Chao
;
Chen, Qian
;
Yu, Yingjie
;
Asundi, Anand Krishna
2010
Tunable micro-optofluidic prism based on liquid-core liquid-cladding configuration
Song, Chaolong
;
Nguyen, Nam-Trun
;
Asundi, Anand Krishna
;
Tan, Say-Hwa
2011
Tunable optofluidic aperture configured by a liquid-core/liquid-cladding structure
Song, Chaolong
;
Nguyen, Nam-Trung
;
Asundi, Anand Krishna
;
Low, Cassandra Lee-Ngo
2010
A tuneable micro-optofluidic biconvex lens with mathematically predictable focal length
Song, Chaolong
;
Nguyen, Nam-Trung
;
Tan, Say-Hwa
;
Asundi, Anand Krishna
2002
Unified digital photoelasticity : a tool for stress analysis
Liu, Tong.
2011
Whole field curvature and residual stress determination of silicon wafers by reflectometry
Ng, Chi Seng
;
Asundi, Anand Krishna