Browsing by Author Bersuker, G.
Showing results 1 to 4 of 4
|2011||Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopy||Yew, K. S.; Bersuker, G.; Ang, Diing Shenp|
|2013||Electron trap transformation under positive-bias temperature stressing||Gao, Yuan; Ang, Diing Shenp; Bersuker, G.; Young, C. D.|
|2012||Evidence for the transformation of switching hole traps into permanent bulk traps under negative-bias temperature stressing of high-k P-MOSFETs||Gao, Yuan; Ang, Diing Shenp; Young, C. D.; Bersuker, G.|
|2015||White-light-induced disruption of nanoscale conducting filament in hafnia||Zhang, H. Z.; Bersuker, G.; Zhou, Y.; Yew, Kwang Sing; Ang, Diing Shenp; Kawashima, Tomohito; Bera, Milan Kumar|