Browsing by Author Bosman, Michel
Showing results 15 to 29 of 29
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
 | 2014 | Leakage current and structural analysis of annealed HfO2/La2O3 and CeO2/La2O3 dielectric stacks : a nanoscopic study | Shubhakar, Kalya; Pey, Kin Leong; Kouda, Miyuki; Kakushima, Kuniyuki; Iwai, Hiroshi; Bosman, Michel; Kushvaha, Sunil Singh; O'Shea, Sean Joseph |
| 2013 | Multi-layered liposomes as optical resonators | Yong, Derrick; Ng, Wei Long; Lee, Elizabeth; Yu, Xia; Bosman, Michel; Chan, Chi Chiu |
| 2013 | Multiferroicity in manganite/titanate superlattices determined by oxygen pressure-mediated cation defects | Li, Z.; You, Lu; Yang, Zai; Tan, H. R.; Ren, P.; Chen, Xiaofeng; Pan, J. S.; Wang, J. L.; Wang, L.; Bosman, Michel; Zhu, Weimin (EEE); Dong, Zhili |
| 2012 | Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEM | Shubhakar, K.; Pey, Kin Leong; Bosman, Michel; Thamankar, R.; Kushvaha, S. S.; Loke, Y. C.; Wang, Z. R.; Raghavan, Nagarajan; Wu, X.; O'Shea, S. J. | |
| 2012 | Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching | Raghavan, Nagarajan; Pey, Kin Leong; Wu, Xing; Liu, Wenhu; Bosman, Michel | |
| 2013 | Resilience of ultra-thin oxynitride films to percolative wear-out and reliability implications for high-κ stacks at low voltage stress | Raghavan, Nagarajan; Padovani, Andrea; Li, Xiang; Bosman, Michel; Wu, Xing; Lip Lo, Vui; Larcher, Luca; Leong Pey, Kin |
| 2012 | Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks | Raghavan, Nagarajan; Pey, Kin Leong; Shubhakar, K.; Wu, X.; Liu, W. H.; Bosman, Michel | |
| 2012 | Spin-polarized wide electron slabs in functionally graded polar oxide heterostructures | Ye, Jiandong; Lim, Sze Ter; Bosman, Michel; Gu, Shulin; Zheng, Youdou; Tan, Hark Hoe; Jagadish, Chennupati; Sun, Xiaowei; Teo, Kie Leong |
| 2015 | Stabilization of 4H hexagonal phase in gold nanoribbons | Fan, Zhanxi; Bosman, Michel; Huang, Xiao; Huang, Ding; Yu, Yi; Ong, Khuong P.; Akimov, Yuriy A.; Wu, Lin; Li, Bing; Wu, Jumiati; Huang, Ying; Liu, Qing; Png, Ching Eng; Gan, Chee Lip; Yang, Peidong; Zhang, Hua |
| 2012 | Study of charge distribution and charge loss in dual-layer metal-nanocrystal-embedded high-κ/SiO2 gate stack | Lwin, Z. Z.; Pey, Kin Leong; Zhang, Q.; Bosman, Michel; Liu, Q.; Gan, C. L.; Singh, P. K.; Mahapatra, S. |
| 2012 | Subthreshold characteristics of ballistic electron emission spectra | Qin, H. L.; Goh, K. E. J.; Bosman, Michel; Pey, Kin Leong; Troadec, C. |
| 2013 | Surfactant-free sub-2 nm ultrathin triangular gold nanoframes | Mohammad Mehdi Shahjamali; Bosman, Michel; Cao, Shao-Wen; Huang, Xiao; Cao, Xiehong; Zhang, Hua; Pramana, Stevin Snellius; Xue, Can | |
| 2011 | Thermal conductivity of nanocrystalline carbon films studied by pulsed photothermal reflectance | Shakerzadeh, Maziar; Samani, M. K.; Khosravian, Narjes; Teo, Edwin Hang Tong; Bosman, Michel; Tay, Beng Kang | |
| 2012 | Three-dimensional tubular arrays of MnO2–NiO nanoflakes with high areal pseudocapacitance | Liu, Jinping; Fan, Hong Jin; Jiang, Jian; Bosman, Michel | |
| 2012 | Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications | Liu, W. H.; Pey, Kin Leong; Raghavan, Nagarajan; Wu, X.; Bosman, Michel |