Browsing by Author Bosman, Michel

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Showing results 19 to 29 of 29 < previous 
Issue DateTitleAuthor(s)
 2012Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switchingRaghavan, Nagarajan; Pey, Kin Leong; Wu, Xing; Liu, Wenhu; Bosman, Michel
2013Resilience of ultra-thin oxynitride films to percolative wear-out and reliability implications for high-κ stacks at low voltage stressRaghavan, Nagarajan; Padovani, Andrea; Li, Xiang; Bosman, Michel; Wu, Xing; Lip Lo, Vui; Larcher, Luca; Leong Pey, Kin
 2012Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacksRaghavan, Nagarajan; Pey, Kin Leong; Shubhakar, K.; Wu, X.; Liu, W. H.; Bosman, Michel
2012Spin-polarized wide electron slabs in functionally graded polar oxide heterostructuresYe, Jiandong; Lim, Sze Ter; Bosman, Michel; Gu, Shulin; Zheng, Youdou; Tan, Hark Hoe; Jagadish, Chennupati; Sun, Xiaowei; Teo, Kie Leong
2015Stabilization of 4H hexagonal phase in gold nanoribbonsFan, Zhanxi; Bosman, Michel; Huang, Xiao; Huang, Ding; Yu, Yi; Ong, Khuong P.; Akimov, Yuriy A.; Wu, Lin; Li, Bing; Wu, Jumiati; Huang, Ying; Liu, Qing; Png, Ching Eng; Gan, Chee Lip; Yang, Peidong; Zhang, Hua
2012Study of charge distribution and charge loss in dual-layer metal-nanocrystal-embedded high-κ/SiO2 gate stackLwin, Z. Z.; Pey, Kin Leong; Zhang, Q.; Bosman, Michel; Liu, Q.; Gan, C. L.; Singh, P. K.; Mahapatra, S.
2012Subthreshold characteristics of ballistic electron emission spectraQin, H. L.; Goh, K. E. J.; Bosman, Michel; Pey, Kin Leong; Troadec, C.
 2013Surfactant-free sub-2 nm ultrathin triangular gold nanoframesMohammad Mehdi Shahjamali; Bosman, Michel; Cao, Shao-Wen; Huang, Xiao; Cao, Xiehong; Zhang, Hua; Pramana, Stevin Snellius; Xue, Can
 2011Thermal conductivity of nanocrystalline carbon films studied by pulsed photothermal reflectanceShakerzadeh, Maziar; Samani, M. K.; Khosravian, Narjes; Teo, Edwin Hang Tong; Bosman, Michel; Tay, Beng Kang
 2012Three-dimensional tubular arrays of MnO2–NiO nanoflakes with high areal pseudocapacitanceLiu, Jinping; Fan, Hong Jin; Jiang, Jian; Bosman, Michel
2012Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implicationsLiu, W. H.; Pey, Kin Leong; Raghavan, Nagarajan; Wu, X.; Bosman, Michel