Browsing by Author Dev, Kapil


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Showing results 7 to 8 of 8 < previous 
Issue DateTitleAuthor(s)
2016Subwavelength metrology of Al wire grating employing finite difference time domain method and Mueller matrix polarimeterAdhikari, Achyut; Dev, Kapil; Asundi, Anand
2017Surface roughness measurement of additive manufactured samples using angular speckle correlationDev, Kapil; A. S., Guru Prasad; H, Aswin; P, Prabhathan; Chan, Kelvin H. K.; Matham, Murukeshan Vadakke