Browsing by Author
Gu, Renyuan
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) |
| 2019 | The role of the disordered HfO2 network in the high- κ n-MOSFET shallow electron trapping | Gu, Chenjie; Zhou, Canliang; Ang, Diing Shenp; Ju, Xin; Gu, Renyuan; Duan, Tianli |
| 2017 | A vacancy-interstitial defect pair model for positive-bias temperature stress-induced electron trapping transformation in the high-κ gate n-MOSFET | Gu, Chenjie; Ang, Diing Shenp; Gao, Yuan; Gu, Renyuan; Zhao, Ziqi; Zhu, Chao |