Browsing by Author
Lim, Meng Keong
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) |
| 2015 | Electromigration reliability study on copper interconnects under pulsed current conditions | Lim, Meng Keong |
| 2011 | Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress | Lim, Meng Keong; Lin, Jingyuan; Ee, Elden Yong Chiang; Ng, Chee Mang; Wei, Jun; Gan, Chee Lip |
| 2012 | Impact of pre-existing voids on electromigration in copper interconnects | Mario, Hendro; Lim, Meng Keong; Gan, Chee Lip |
| 2012 | Metal electroplating of three dimensional (3D) electrode in electrolyte-less dye sensitized solar cells (ELDSC) | Lim, Meng Keong; Jin, Ziyu; Gan, Chee Lip; Leong, Kam Chew; Wong, C. C.; Ong, Duen Yang |