Browsing by Author
Ong, Vincent K. S.
Showing results 1 to 11 of 11
| Issue Date | Title | Author(s) |
| 2008 | Charge collection from within a collecting junction well | Kurniawan, Oka.; Ong, Vincent K. S. |
| 2009 | Choice of generation volume models for electron beam induced current computation | Ong, Vincent K. S.; Kurniawan, Oka. |
| 2009 | Computation of charge collection probability for any collecting junction shape | Ong, Vincent K. S.; Tan, Chee Chin; Kurniawan, Oka; Li, Erping |
| 2001 | Determination of diffusion length from within a confined region with the use of EBIC | Ong, Vincent K. S.; Wu, Dethau. |
| 2006 | Determination of diffusion lengths with the use of EBIC from a diffused junction with any values of junction depths | Ong, Vincent K. S.; Kurniawan, Oka. |
| 2002 | Determination of material parameters from regions close to the collector using electron beam-induced current | Wu, Dethau.; Ong, Vincent K. S. |
| 2002 | Determining the location of localized defect in the perpendicular junction configuration with the use of electron beam induced current | Phua, Poh Chin.; Ong, Vincent K. S. |
| 2009 | Extraction of diffusion length using junction-less EBIC | Ong, Vincent K. S.; Tan, Chee Chin.; Radhakrishnan, K. |
| 2012 | The study of the charge collection of the normal-collector configuration | Tan, Chee Chin.; Ong, Vincent K. S.; Radhakrishnan, K. |
| 2000 | Theory of the single contact electron beam induced current effect | Lau, K. T.; Ong, Vincent K. S.; Ma, Jianguo |
| 2008 | An ultra low-power successive approximation ADC using an offset-biased auto-zero comparator | Chan, Pak Kwong; Susanti, Yulia; Ong, Vincent K. S. |