Showing results 45 to 64 of 64
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| Issue Date | Title | Author(s) |
| 2005 | On the morphological changes of Ni- and Ni(Pt)-silicides | Mangelinck, D.; Osipowicz, T.; Lee, Pooi See; Pey, Kin Leong; Chi, Dong Zhi |
| 2000 | On the Ni–Si phase transformation with/without native oxide | Mangelinck, D.; Dai, J. Y.; Ho, C. S.; See, A.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun |
| 2012 | Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching | Raghavan, Nagarajan; Pey, Kin Leong; Wu, Xing; Liu, Wenhu; Bosman, Michel |
| 2002 | Phase and layer stability of Ni- and Ni(Pt)-silicides on narrow poly-Si lines | Mangelinck, D.; Dai, J. Y.; Chan, L.; Ding, Jun; Chi, Dong Zhi; Lee, Pooi See; Pey, Kin Leong |
| 2006 | Pulsed laser induced silicidation on TiN-capped Co/Si bilayers | Chow, F. L.; Lee, Pooi See; Pey, Kin Leong; Tang, L. J.; Tung, Chih Hang; Wang, X. C.; Lim, G. C. |
| 2006 | Pyramidal structural defects in erbium silicide thin films | Srolovitz, David J.; Tan, Eu Jin; Bouville, Mathieu; Chi, Dong Zhi; Pey, Kin Leong; Lee, Pooi See; Tung, Chih Hang |
| 2014 | Robust electromigration reliability through engineering optimization | Tee, Kheng Chok; Ee, Yong Chiang; Aubel, Oliver; Pey, Kin Leong; Ng, Wee Loon; Liu, Junfeng; Tan, Chuan Seng |
| 2012 | Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks | Raghavan, Nagarajan; Pey, Kin Leong; Shubhakar, K.; Wu, X.; Liu, W. H.; Bosman, Michel |
| 2006 | Role of low temperature rapid thermal annealing in post-laser-annealed p-channel metal-oxide-semiconductor field effect transistor | Ong, K. K.; Pey, Kin Leong; Lee, Pooi See; Wee, A. T. S.; Wang, X. C.; Tung, Chih Hang; Tang, L. J.; Chong, Y. F. |
| 2004 | Silicide formation from laser thermal processing of Ti/Co bilayers | Chow, F. L.; Pey, Kin Leong; Lee, Pooi See; Tung, Chih Hang; Wang, X. C.; Lim, G. C.; Chong, Y. F. |
| 2003 | Simulation of stress in advanced silicided device structures | Wong, Michael Hon Weng. |
| 2014 | Stable cyclic performance of nickel oxide–carbon composite anode for lithium-ion batteries | Wang, Xinghui; Susantyoko, Rahmat Agung; Fan, Yu; Xiao, Qizhen; Pey, Kin Leong; Zhang, Qing; Fitzgerald, Eugene |
| 2012 | Study of charge distribution and charge loss in dual-layer metal-nanocrystal-embedded high-κ/SiO2 gate stack | Lwin, Z. Z.; Pey, Kin Leong; Zhang, Q.; Bosman, Michel; Liu, Q.; Gan, C. L.; Singh, P. K.; Mahapatra, S. |
| 2005 | Study of dopant redistribution during gate oxide breakdown in narrow MOSFETs | Lim, Wai Tat. |
| 2012 | Subthreshold characteristics of ballistic electron emission spectra | Qin, H. L.; Goh, K. E. J.; Bosman, Michel; Pey, Kin Leong; Troadec, C. |
| 2012 | Temperature-dependent relaxation current on single and dual layer Pt metal nanocrystal-based Al2O3/SiO2 gate stack | Pey, Kin Leong; Mahapatra, S.; Chen, Y. N.; Goh, K. E. J.; Wu, X.; Lwin, Z. Z.; Singh, P. K. |
| 2009 | Textured Ni(Pt) germanosilicide formation on a condensed Si1-xGex/Si substrate | Setiawan, Y.; Balakumar, S.; Tan, Eu Jin; Pey, Kin Leong; Lee, Pooi See |
| 2002 | Thermal reaction of nickel and Si0.75Ge0.25 alloy | Pey, Kin Leong; Chattopadhyay, Sujay; Lee, Pooi See; Choi, W. K.; Zhao, H. B.; Antoniadis, D. A.; Fitzgerald, Eugene A. |
| 2012 | Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications | Liu, W. H.; Pey, Kin Leong; Raghavan, Nagarajan; Wu, X.; Bosman, Michel |
| 2012 | Vertical silicon nanowire diode with nickel silicide induced dopant segregation | Li, Xiang; Tan, Chuan Seng; Lu, Weijie; Pey, Kin Leong; Wang, Xinpeng; Chen, Zhixian; Navab, Singh; Leong, Kam Chew; Gan, Chee Lip |