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Raghavan, Nagarajan
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Showing results 7 to 17 of 17
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Issue Date
Title
Author(s)
2010
Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency
Tan, Cher Ming
;
Raghavan, Nagarajan
2013
Intrinsic nanofilamentation in resistive switching
Migas, Dmitri B.
;
Borisenko, Victor E.
;
Wu, Xing
;
Cha, Dongkyu
;
Bosman, Michel
;
Raghavan, Nagarajan
;
Zhang, Xi Xiang
;
Li, Kun
;
Pey, Kin Leong
2023
Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications
Sahay, Rahul
;
Tu, Yen-Cheng
;
Aziz, Izzat
;
Budiman, Arief S.
;
Tan, Cher Ming
;
Lee, Pooi See
;
Thomas, Olivier
;
Raghavan, Nagarajan
2012
Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEM
Shubhakar, K.
;
Pey, Kin Leong
;
Bosman, Michel
;
Thamankar, R.
;
Kushvaha, S. S.
;
Loke, Y. C.
;
Wang, Z. R.
;
Raghavan, Nagarajan
;
Wu, X.
;
O'Shea, S. J.
2012
Percolative model and thermodynamic analysis of oxygen-ion-mediated resistive switching
Raghavan, Nagarajan
;
Pey, Kin Leong
;
Wu, Xing
;
Liu, Wenhu
;
Bosman, Michel
2018
A rapid design exploration framework under additive manufacturing process uncertainty
Xiong, Yi
;
Duong, Pham Luu Trung
;
Raghavan, Nagarajan
;
Rosen, David W
2013
Resilience of ultra-thin oxynitride films to percolative wear-out and reliability implications for high-κ stacks at low voltage stress
Raghavan, Nagarajan
;
Padovani, Andrea
;
Li, Xiang
;
Bosman, Michel
;
Wu, Xing
;
Lip Lo, Vui
;
Larcher, Luca
;
Leong Pey, Kin
2012
Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacks
Raghavan, Nagarajan
;
Pey, Kin Leong
;
Shubhakar, K.
;
Wu, X.
;
Liu, W. H.
;
Bosman, Michel
2023
Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction
Navarro, Etienne
;
Cornelius, Thomas W.
;
Proudhon, Henry
;
Sahay, Rahul
;
Radchenko, Ihor
;
Escoubas, Stephanie
;
Lee, Pooi See
;
Raghavan, Nagarajan
;
Budiman, Arief S.
;
Thomas, Olivier
2008
Statistical modeling of via redundancy effects on interconnect reliability
Tan, Cher Ming
;
Raghavan, Nagarajan
2012
Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications
Liu, W. H.
;
Pey, Kin Leong
;
Raghavan, Nagarajan
;
Wu, X.
;
Bosman, Michel