Browsing by Author Raghavan, Nagarajan


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Showing results 11 to 15 of 15 < previous 
Issue DateTitleAuthor(s)
2018A rapid design exploration framework under additive manufacturing process uncertaintyXiong, Yi; Duong, Pham Luu Trung; Raghavan, Nagarajan; Rosen, David W
2013Resilience of ultra-thin oxynitride films to percolative wear-out and reliability implications for high-κ stacks at low voltage stressRaghavan, Nagarajan; Padovani, Andrea; Li, Xiang; Bosman, Michel; Wu, Xing; Lip Lo, Vui; Larcher, Luca; Leong Pey, Kin
 2012Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacksRaghavan, Nagarajan; Pey, Kin Leong; Shubhakar, K.; Wu, X.; Liu, W. H.; Bosman, Michel
2008Statistical modeling of via redundancy effects on interconnect reliabilityTan, Cher Ming; Raghavan, Nagarajan
2012Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implicationsLiu, W. H.; Pey, Kin Leong; Raghavan, Nagarajan; Wu, X.; Bosman, Michel