Browsing by Author Raghavan, Nagarajan
Showing results 14 to 15 of 15
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
 | 2008 | Statistical modeling of via redundancy effects on interconnect reliability | Tan, Cher Ming; Raghavan, Nagarajan |
| 2012 | Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implications | Liu, W. H.; Pey, Kin Leong; Raghavan, Nagarajan; Wu, X.; Bosman, Michel |