Browsing by Author Tse, Man Siu

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Showing results 41 to 43 of 43 < previous 
Issue DateTitleAuthor(s)
2004Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopyLau, Hon Wu; Ng, Chi Yung; Liu, Yang; Tse, Man Siu; Lim, Vanissa Sei Wei; Tan, Ooi Kiang; Chen, Tupei
2000Wafer level electromigration reliability study of deep submicron via for multilevel metallizationLoh, Wye Boon.
2002Wafer-level isothermal electromigration study on deep sub-micron interconnect metallizationLim, Yeow Kheng.