Showing results 30 to 38 of 38
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| Issue Date | Title | Author(s) |
| | 2017 | Quality assessment of DIBR-synthesized images by measuring local geometric distortions and global sharpness | Li, Leida; Zhou, Yu; Gu, Ke; Lin, Weisi; Wang, Shiqi |
 | 2015 | Restoration of postbreakdown gate oxide by white-light illumination | Kawashima, Tomohito; Yew, Kwang Sing; Zhou, Yu; Ang, Diing Shenp; Bera, Milan Kumar; Zhang, Haizhong |
| 2019 | Room temperature nanocavity laser with interlayer excitons in 2D heterostructures | Liu, Yuanda; Fang, Hanlin; Abdullah Rasmita; Zhou, Yu; Li, Juntao; Yu, Ting; Xiong, Qihua; Zheludev, Nikolay; Liu, Jin; Gao, Weibo |
| 2018 | Room temperature solid-state quantum emitters in the telecom range | Zhou, Yu; Wang, Ziyu; Rasmita, Abdullah; Kim, Sejeong; Berhane, Amanuel; Bodrog, Zoltán; Adamo, Giorgio; Gali, Adam; Aharonovich, Igor; Gao, Wei-bo |
| 2017 | Self-protected thermometry with infrared photons and defect spins in silicon carbide | Zhou, Yu; Wang, Junfeng; Zhang, Xiaoming; Li, Ke; Cai, Jianming; Gao, Weibo |
| 2018 | Single-photon sources in diamond, silicon carbide and gallium nitride | Zhou, Yu |
| 2018 | Surface ablation of 52100 bearing steel using femtosecond laser irradiation | Maharjan, Niroj; Zhou, Wei; Zhou, Yu |
| 2017 | TiN-Mediated Multi-Level Negative Photoconductance of the ZrO2 Breakdown Path | Zhou, Yu; Kawashima, Tomohito; Ang, Diing Shenp |
| 2015 | White-light-induced annihilation of percolation paths in SIO2 and high-k dielectrics - prospect for gate oxide reliability rejuvenation and optical-enabled functions in CMOS integrated circuits | Ang, Diing Shenp; Kawashima, Tomohito; Zhou, Yu; Yew, Kwang Sing; Bera, Milan Kumar; Zhang, Haizhong |
