Browsing by Author Aubel, Oliver
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
 | 2014 | Robust electromigration reliability through engineering optimization | Tee, Kheng Chok; Ee, Yong Chiang; Aubel, Oliver; Pey, Kin Leong; Ng, Wee Loon; Liu, Junfeng; Tan, Chuan Seng |