Browsing by Author Bersuker, G.
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 2011 | Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopy | Yew, K. S.; Bersuker, G.; Ang, Diing Shenp | |
 | 2013 | Electron trap transformation under positive-bias temperature stressing | Gao, Yuan; Ang, Diing Shenp; Bersuker, G.; Young, C. D. |
| 2012 | Evidence for the transformation of switching hole traps into permanent bulk traps under negative-bias temperature stressing of high-k P-MOSFETs | Gao, Yuan; Ang, Diing Shenp; Young, C. D.; Bersuker, G. | |
| 2015 | White-light-induced disruption of nanoscale conducting filament in hafnia | Zhang, H. Z.; Bersuker, G.; Zhou, Y.; Yew, Kwang Sing; Ang, Diing Shenp; Kawashima, Tomohito; Bera, Milan Kumar |