Browsing by Author Gu, Chenjie

Showing results 1 to 4 of 4
Issue DateTitleAuthor(s)
2015Atomistic simulation study of high-κ oxide defects for understanding gate stack and RRAM reliabilityGu, Chenjie
2020A novel fabrication technique for three-dimensional concave nanolens arraysDuan, Tianli; Xu, Kang; Liu, Zhihong; Gu, Chenjie; Pan, Jisheng; Ang, Diing Shenp; Zhang, Rui; Wang, Yao; Ma, Xuhang
2019The role of the disordered HfO2 network in the high- κ n-MOSFET shallow electron trappingGu, Chenjie; Zhou, Canliang; Ang, Diing Shenp; Ju, Xin; Gu, Renyuan; Duan, Tianli
2017A vacancy-interstitial defect pair model for positive-bias temperature stress-induced electron trapping transformation in the high-κ gate n-MOSFETGu, Chenjie; Ang, Diing Shenp; Gao, Yuan; Gu, Renyuan; Zhao, Ziqi; Zhu, Chao