Browsing by Author Gu, Renyuan

Showing results 1 to 2 of 2
Issue DateTitleAuthor(s)
2019The role of the disordered HfO2 network in the high- κ n-MOSFET shallow electron trappingGu, Chenjie; Zhou, Canliang; Ang, Diing Shenp; Ju, Xin; Gu, Renyuan; Duan, Tianli
2017A vacancy-interstitial defect pair model for positive-bias temperature stress-induced electron trapping transformation in the high-κ gate n-MOSFETGu, Chenjie; Ang, Diing Shenp; Gao, Yuan; Gu, Renyuan; Zhao, Ziqi; Zhu, Chao