Browsing by Author He, Feifei

Showing results 1 to 7 of 7
Issue DateTitleAuthor(s)
20093D circuit model for 3D IC reliability studyTan, Cher Ming; He, Feifei
20123D simulation-based research on the effect of interconnect structures on circuit reliabilityHe, Feifei; Tan, Cher Ming
 2014Ab initio simulation of electronic and mechanical properties of aluminium for fatigue early feature investigationZhang, Shuai; Tan, Cher Ming; Cheng, Shuguang; Deng, Tianqi; He, Feifei; Su, Haibin
 2011Comparison of electromigration simulation in test structure and actual circuitHe, Feifei; Tan, Cher Ming
 2012Degradation behavior of high power light emitting diode under high frequency switchingChen, S. H.; Tan, G. H.; Tan, Cher Ming; He, Feifei
 2011Effect of IC layout on the reliability of CMOS amplifiersHe, Feifei; Tan, Cher Ming
 2011Electromigration reliability of interconnections in RF low noise amplifier circuitHe, Feifei; Tan, Cher Ming