Browsing by Author Hua, Younan

Showing results 1 to 4 of 4
Issue DateTitleAuthor(s)
2018Electron-beam radiation induced degradation of silicon nitride and its impact to semiconductor failure analysis by TEMLiu, Binghai; Dong, Zhi Li; Hua, Younan; Fu, Chao; Li, Xiaomin; Tan, Pik Kee; Zhao, Yuzhe
1998Failure analysis of bond pad metal peeling using FIB and AFMTan, Cher Ming; Er, Eddie; Hua, Younan; Chai, Vincent Siew Heong
2018One-step synthesis of metal/semiconductor heterostructure NbS2/MoS2Fu, Qundong; Wang, Xiaowei; Zhou, Jiadong; Xia, Juan; Zeng, Qinsheng; Lv, Danhui; Zhu, Chao; Wang, Xiaolei; Shen, Yue; Li, Xiaomin; Hua, Younan; Liu, Fucai; Shen, Zexiang; Jin, Chuanhong; Liu, Zheng
 2018The overview of the impacts of electron radiation on semiconductor failure analysis by SEM, FIB and TEMLiu, Binghai; Hua, Younan; Dong, Zhili; Tan, Pik Kee; Zhao, Yuzhe; Mo, Zhiqiang; Lam, Jeffrey; Mai, Zhihong