Browsing by Author Lau, W. S.
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|2012||Mechanisms of difficulty to correlate the leakage current of high-k capacitor structures with defect states detected spectroscopically by the thermally stimulated current technique||Lau, W. S.|
|2012||The role of a tensile stress bias for a sensitive silicon mechanical stress sensor based on a change in gate-induced-drain leakage current||Lau, W. S.; Yang, Peizhen.; Siah, S. Y.; Chan, L.|