Browsing by Author Liu, X. Y.

Showing results 1 to 3 of 3
Issue DateTitleAuthor(s)
 2012Improvement of endurance degradation for oxide based resistive switching memory devices correlated with oxygen vacancy accumulation effectGao, Bin; Yu, Hongyu; Lu, Y.; Chen, B.; Fang, Z.; Fu, Y. H.; Yang, J. Q.; Liu, L. F.; Liu, X. Y.; Kang, J. F.
 2012Microscopic mechanism for unipolar resistive switching behaviour of nickel oxidesChen, Y. S.; Kang, J. F.; Chen, B.; Liu, L. F.; Liu, X. Y.; Wang, Y. Y.; Wu, L.; Wang, J. Y.; Chen, Q.; Wang, E. G.; Gao, Bin; Yu, Hongyu
 2012Oxide-based RRAM : a novel defect-engineering-based implementation for multilevel data storageGao, Bin; Yu, Hongyu; Kang, J. F.; Chen, B.; Liu, L. F.; Liu, X. Y.; Wang, Z. R.; Yu, B.