Browsing by Author Mangelinck, D.

Showing results 1 to 15 of 15
Issue DateTitleAuthor(s)
 2003Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometryPey, Kin Leong; Lee, Pooi See; Mangelinck, D.; Osipowitcz, T.
2001Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodesMangelinck, D.; Lahiri, S. K.; Chi, Dong Zhi; Lee, Pooi See; Pey, Kin Leong
2002Effect of ion implantation on layer inversion of Ni silicided poly-SiMangelinck, D.; Osipowicz, T.; Dai, J. Y.; Chan, L.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun; Chi, Dong Zhi
 2002Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stackMangelinck, D.; Osipowicz, T.; Dai, J. Y.; See, A.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun; Chi, Dong Zhi
2000Improved NiSi salicide process using presilicide N2+ implant for MOSFETsWee, A. T. S.; Chan, L.; Mangelinck, D.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun
 2003In situ XRD analysis of Ni(Pt)/Si(100) reactions in low temperature regime ≤400°CMangelinck, D.; Chan, L.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun
2002Layer inversion of Ni(Pt)Si on mixed phase Si filmsOsipowicz, T.; See, A.; Mangelinck, D.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun
2000Micro-Raman spectroscopy investigation of nickel silicides and nickel (platinum) silicidesMangelinck, D.; Osipowicz, T.; See, A.; Lee, Pooi See; Pey, Kin Leong; Shen, Zexiang; Ding, Jun
 2001Micro-RBS study of nickel silicide formationLee, Pooi See; Sum, Tze Chien; Seng, H. L.; Osipowicz, T.; Mangelinck, D.; Watt, F.
2001New salicidation technology with Ni(Pt) alloy for MOSFETsMangelinck, D.; Chan, L.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun; Chi, Dong Zhi
 2004Ni(Pt) alloy silicidation on (100) Si and poly-silicon linesPey, Kin Leong; Lee, Pooi See; Mangelinck, D.
 2001Nickel silicide formation on Si(100) and Poly-Si with a presilicide N2 + implantationMangelinck, D.; Dai, J. Y.; See, A.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun; Chi, Dong Zhi
2005On the morphological changes of Ni- and Ni(Pt)-silicidesMangelinck, D.; Osipowicz, T.; Lee, Pooi See; Pey, Kin Leong; Chi, Dong Zhi
 2000On the Ni–Si phase transformation with/without native oxideMangelinck, D.; Dai, J. Y.; Ho, C. S.; See, A.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun
2002Phase and layer stability of Ni- and Ni(Pt)-silicides on narrow poly-Si linesMangelinck, D.; Dai, J. Y.; Chan, L.; Ding, Jun; Chi, Dong Zhi; Lee, Pooi See; Pey, Kin Leong