Browsing by Author Ng, Chi Seng

Showing results 1 to 3 of 3
Issue DateTitleAuthor(s)
 2011Fast full-field out-of-plane deformation measurement using fringe reflectometryHuang, Lei; Ng, Chi Seng; Asundi, Anand Krishna
2011Rapid defect detections of bonded wafer using near infrared polariscopeAsundi, Anand Krishna; Ng, Chi Seng
2011Whole field curvature and residual stress determination of silicon wafers by reflectometryNg, Chi Seng; Asundi, Anand Krishna