Browsing by Author Ong, Hock Guan

Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
 2010All-carbon electronic devices fabricated by directly grown single-walled carbon nanotubes on reduced graphene oxide electrodesBoey, Freddy Yin Chiang; Li, Bing; Cao, Xiehong; Ong, Hock Guan; Cheah, Jun Wei; Zhou, Xiaozhu; Yin, Zongyou; Li, Hai; Wang, Junling; Huang, Wei; Zhang, Hua
2008Charge injection at carbon nanotube-SiO2 interfaceOng, Hock Guan; Cheah, Jun Wei; Chen, Lang; TangTang, Hosea; Xu, Yanping; Li, Bing; Zhang, Hua; Li, Lain-Jong; Wang, Junling
2016Comprehensive laser sensitivity profiling and data register bit-flips in 65 nm FPGAHe, Wei; Breier, Jakub; Bhasin, Shivam; Jap, Dirmanto; Ong, Hock Guan; Gan, Chee Lip
2017Extensive Laser Fault Injection Profiling of 65 nm FPGABreier, Jakub; He, Wei; Bhasin, Shivam; Jap, Dirmanto; Chef, Samuel; Ong, Hock Guan; Gan, Chee Lip
 2012Highly electrically conductive layered carbon derived from polydopamine and its functions in SnO2-based lithium ion battery anodesKong, Junhua; Yee, Wu Aik; Yang, Liping; Wei, Yuefan; Phua, Si Lei; Ong, Hock Guan; Ang, Jia Ming; Li, Xu; Lu, Xuehong
2008N-type behavior of ferroelectric-gate carbon nanotube network transistorCheah, Jun Wei; Shi, Yumeng; Ong, Hock Guan; Lee, Chun Wei; Li, Lain-Jong; Wang, Junling
 2011Origin of hysteresis in the transfer characteristic of carbon nanotube field effect transistorOng, Hock Guan; Cheah, Jun Wei; Zou, X.; Li, B.; Cao, X. H.; Tantang, Hosea; Li, L.-J.; Zhang, Hua; Han, G. C.; Wang, J.
2016Oxygen Vacancy Induced Room-Temperature Metal–Insulator Transition in Nickelate Films and Its Potential Application in PhotovoltaicsWang, Le; Dash, Sibashisa; Chang, Lei; You, Lu; Feng, Yaqing; He, Xu; Jin, Kui-juan; Zhou, Yang; Ong, Hock Guan; Ren, Peng; Wang, Shiwei; Chen, Lang; Wang, Junling
 2008Self-assembled shape- and orientation-controlled synthesis of nanoscale Cu3Si triangles, squares, and wiresWang, Junling; Zhang, Zhou; Wong, Lai Mun; Ong, Hock Guan; Wang, Xin Jiao; Wang, Shijie; Chen, Hongyu; Wu, Tom
 2009Study of charge diffusion at the carbon nanotube-SiO2 interface by electrostatic force microscopyHe, Yingran; Ong, Hock Guan; Zhao, Yang; He, Sailing; Li, Lain-Jong; Wang, Junling