Browsing by Author Pey, Kin Leong

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Issue DateTitleAuthor(s)
2014Analysis of correlated gate and drain random telegraph noise in post-soft breakdownTiN/HfLaO/SiOx nMOSFETsLiu, Wenhu; Padovani, Andrea; Larcher, Luca; Raghavan, Nagarajan; Pey, Kin Leong
 2003Analysis of laterally non-uniform layers and sub-micron devices by Rutherford backscattering spectrometryPey, Kin Leong; Lee, Pooi See; Mangelinck, D.; Osipowitcz, T.
2012Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopyBosman, Michel; Ong, Beng Sheng; Chiam, Sing Yang; Pey, Kin Leong; Qin, Hailang; Liu, Zhiqiang; Troadec, Cedric; Goh, Johnson Kuan Eng
 2004Characterization of the junction leakage of Ti-capped Ni-silicided junctionsLee, Pooi See; Pey, Kin Leong; Toledo, N. G.
2013Charge transport in lightly reduced graphene oxide : a transport energy perspectiveKajen, R. S.; Pey, Kin Leong; Vijila, C.; Jaiswal, M.; Saravanan, S.; Ng, Andrew M. H.; Wong, C. P.; Loh, K. P.; Chandrasekhar, Natarajan
2001Comparative study of current-voltage characteristics of Ni and Ni(Pt)- alloy silicided p+/n diodesMangelinck, D.; Lahiri, S. K.; Chi, Dong Zhi; Lee, Pooi See; Pey, Kin Leong
2011Comparison between chemical vapor deposited and physical vapor deposited WSi2 metal gate for InGaAs n-metal-oxide-semiconductor field-effect transistorsOng, B. S.; Pey, Kin Leong; Ong, C. Y.; Tan, Chuan Seng; Antoniadis, D. A.; Fitzgerald, E. A.
2008Demonstration of Schottky barrier NMOS transistors with erbium silicided source/drain and silicon nanowire channelCui, Guangda; Lee, Pooi See; Chi, Dong Zhi; Chin, Yoke King; Hoe, Keat Mun; Tan, Eu Jin; Pey, Kin Leong; Singh, Navab; Lo, Guo-Qiang
 2012Dielectric breakdown - recovery in logic and resistive switching in memory : bridging the gap between the two phenomenaPey, Kin Leong; Raghavan, Nagarajan; Wu, Xing; Liu, Wenhu; Bosman, Michel
 2012Effect of copper TSV annealing on via protrusion for TSV wafer fabricationHeryanto, A.; Putra, W. N.; Trigg, Alastair David; Gao, S.; Kwon, W. S.; Che, Faxing; Ang, X. F.; Wei, J.; Made, Riko I.; Gan, Chee Lip; Pey, Kin Leong
2002Effect of ion implantation on layer inversion of Ni silicided poly-SiMangelinck, D.; Osipowicz, T.; Dai, J. Y.; Chan, L.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun; Chi, Dong Zhi
2012Effect of surface contamination on electron tunneling in the high bias rangeQin, Hailang; Goh, Johnson Kuan Eng; Bosman, Michel; Li, Xiang; Pey, Kin Leong; Troadec, Cedric
 2005Effect of Ti alloying in nickel silicide formationSetiawan, Y.; Tan, C. W.; Lee, Pooi See; Pey, Kin Leong
 2005Effects of Si(001) surface amorphization on ErSi2 thin filmPey, Kin Leong; Lee, Pooi See; Tan, Eu Jin; Kon, M. L.; Zhang, Y. W.; Wang, W. D.; Chi, Dong Zhi
 2004Effects of Ti/Co and Co/Ti systems on the germanosilicidation of poly-Si capped poly-Si1−xGex substrateLi, Y. S.; Lee, Pooi See; Pey, Kin Leong
2012The electronic barrier height of silicon native oxides at different oxidation stagesQin, H. L.; Goh, K. E. J.; Troadec, C.; Bosman, Michel; Pey, Kin Leong
 2002Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stackMangelinck, D.; Osipowicz, T.; Dai, J. Y.; See, A.; Lee, Pooi See; Pey, Kin Leong; Ding, Jun; Chi, Dong Zhi
 2008Erbium silicided schottky source/drain silicon nanowire N-metal–oxide–semiconductor field-effect transistorsTan, Eu Jin; Pey, Kin Leong; Singh, Navab; Chi, Dong Zhi; Lo, Guo-Qiang; Lee, Pooi See; Hoe, Keat Mun; Chin, Yoke King; Cui, Guangda
2009Experimental characterization and modeling of the contact resistance of Cu-Cu bonded interconnectsMade, Riko I.; Thompson, Carl V.; Leong, H. L.; Li, H. Y.; Gan, Chee Lip; Pey, Kin Leong
2012Experimental characterization and modeling of the mechanical properties of Cu–Cu thermocompression bonds for three-dimensional integrated circuitsMade, Riko I.; Thompson, Carl V.; Gan, Chee Lip; Yan, Li Ling; Kor, Katherine Hwee Boon; Chia, Hong Ling; Pey, Kin Leong