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Tan, Cher Ming
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Showing results 1 to 20 of 64
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Issue Date
Title
Author(s)
2009
3D circuit model for 3D IC reliability study
Tan, Cher Ming
;
He, Feifei
2012
3D simulation-based research on the effect of interconnect structures on circuit reliability
He, Feifei
;
Tan, Cher Ming
2014
Ab initio simulation of electronic and mechanical properties of aluminium for fatigue early feature investigation
Zhang, Shuai
;
Tan, Cher Ming
;
Cheng, Shuguang
;
Deng, Tianqi
;
He, Feifei
;
Su, Haibin
2002
Application of low frequency noise in the study of VLSI electromigration
Lim, Shin Yeh.
2002
Application of Wigner–Ville distribution in electromigration noise analysis
Tan, Cher Ming
;
Lim, Shin Yeh
2011
Applications of finite element methods for reliability study of ULSI interconnections
Tan, Cher Ming
;
Li, Wei
;
Gan, Zhenghao
2012
Applications of multi-walled carbon nanotube in electronic packaging
Tan, Cher Ming
;
Baudot, Jacques Desire Charles
;
Han, Yongdian
;
Jing, Hongyang
2010
Characterization of failure in integrated circuit due to electrostatic discharge (ESD)
Goh, Jia Jun.
2002
Characterization techniques for power semiconductor and magnetic drives
Tseng, King Jet
;
Foo, Chek Fok
;
Tan, Cher Ming
2009
Comparative study of non-standard power diodes
Tan, Cher Ming
;
Raghavan, Nagarajan
;
Sun, Lina
;
Hsu, Chuck
;
Wang, Chase
2011
Comparison of electromigration simulation in test structure and actual circuit
He, Feifei
;
Tan, Cher Ming
2006
Comparison of medium-vacuum and plasma-activated low-temperature wafer bonding
Tan, Cher Ming
;
Yu, Weibo
;
Wei, Jun
2009
Comparison of stress-induced voiding phenomena in copper line–via structures with different dielectric materials
Hou, Yuejin
;
Tan, Cher Ming
2012
Creep mitigation in Sn–Ag–Cu composite solder with Ni-coated carbon nanotubes
Nai, S. M. L.
;
Xu, L. Y.
;
Wei, J.
;
Han, Yongdian
;
Jing, Hongyang
;
Tan, Cher Ming
2005
Current crowding effect on copper dual damascene via bottom failure for ULSI applications
Vairagar, A. V.
;
Tan, Cher Ming
;
Arijit, Roy
;
Krishnamoorthy, Ahila
;
Mhaisalkar, Subodh Gautam
2014
Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
Tan, Cher Ming
;
Yu, Wen Zhi
2012
Degradation behavior of high power light emitting diode under high frequency switching
Chen, S. H.
;
Tan, G. H.
;
Tan, Cher Ming
;
He, Feifei
2014
Degradation model of a linear-mode LED driver and its application in lifetime prediction
Lan, Song
;
Tan, Cher Ming
2003
Design and fabrication of insulated gate bipolar transistor (IGBT) using wafer bonding technology
Tan, Cher Ming.
;
Tse, Man Siu.
2002
Design of insulated gate bipolar transistor using novel structure
Zhang, Guowei