Browsing by Author Wang, Z. R.
Showing results 1 to 5 of 5
| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 2012 | Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEM | Shubhakar, K.; Pey, Kin Leong; Bosman, Michel; Thamankar, R.; Kushvaha, S. S.; Loke, Y. C.; Wang, Z. R.; Raghavan, Nagarajan; Wu, X.; O'Shea, S. J. | |
| 2012 | Oxide-based RRAM : a novel defect-engineering-based implementation for multilevel data storage | Gao, Bin; Yu, Hongyu; Kang, J. F.; Chen, B.; Liu, L. F.; Liu, X. Y.; Wang, Z. R.; Yu, B. | |
| 2012 | Positive bias-induced Vth instability in graphene field effect transistors | Liu, W. J.; Fang, Z.; Wang, Z. R.; Wang, F.; Wu, L.; Zhang, J. F.; Wei, J.; Zhu, H. L.; Sun, Xiaowei; Tran, Xuan Anh; Ng, Geok Ing; Yu, Hongyu | |
| 2012 | A self-rectifying HfOx-based unipolar RRAM with NiSi electrode | Tran, Xuan Anh; Gao, Bin; Yu, Hongyu; Zhu, W. G.; Kang, J. F.; Liu, W. J.; Fang, Z.; Wang, Z. R.; Yeo, Y. C.; Nguyen, B. Y.; Li, M. F. | |
| 2012 | Vth shift in single-layer graphene field-effect transistors and its correlation with Raman inspection | Wei, J.; Liu, W. J.; Fang, Z.; Wang, Z. R.; Wang, F.; Wu, L.; Zhang, J. F.; Zhu, H. L.; Sun, Xiaowei; Tran, Xuan Anh; Yu, Hongyu |