Browsing by Author Wu, X.

Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
 2012Closed-form design of Wilkinson power divider with broadband harmonic suppression and size reductionYang, N.; Li, B.; Wu, X.
2014Fabrication of micro-axicons using direct-laser writingHuang, He; Chen, Shijie; Zou, Hongmei; Li, Qing; Fu, Jian; Lin, Feng; Wu, X.
2012Fiber-optic bend sensor using LP21 mode operationFan, Yuqiang.; Wu, George.; Wei, Wanting.; Yuan, Yufeng.; Lin, Feng.; Wu, X.
 2012Nanoscale physical analysis of localized breakdown events in HfO2/SiOX dielectric stacks : a correlation study of STM induced BD with C-AFM and TEMShubhakar, K.; Pey, Kin Leong; Bosman, Michel; Thamankar, R.; Kushvaha, S. S.; Loke, Y. C.; Wang, Z. R.; Raghavan, Nagarajan; Wu, X.; O'Shea, S. J.
 2012Role of grain boundary percolative defects and localized trap generation on the reliability statistics of high-κ gate dielectric stacksRaghavan, Nagarajan; Pey, Kin Leong; Shubhakar, K.; Wu, X.; Liu, W. H.; Bosman, Michel
2005Role of Sb on the growth and optical properties of 1.55 μm GaInN(Sb)As/GaNAs quantum well structures by molecular beam expitaxySun, Handong; Calvez, Stephane; Wu, X.; Wasilewski, Z. R.; Dawson, M. D.; Gupta, J. A.; Sproule, G. I.
2012Temperature-dependent relaxation current on single and dual layer Pt metal nanocrystal-based Al2O3/SiO2 gate stackPey, Kin Leong; Mahapatra, S.; Chen, Y. N.; Goh, K. E. J.; Wu, X.; Lwin, Z. Z.; Singh, P. K.
2012Thermal reversible breakdown and resistivity switching in hafnium dioxideMigas, D. B.; Danilyuk, A. L.; Borisenko, Victor E.; Wu, X.; Raghavan, N.; Danilyuk, M. A.; Pey, K. L.
2008Towards a guided atom interferometer based on a superconducting atom chipMüller, T.; Wu, X.; Mohan, A.; Eyvazov, A.; Wu, Y.; Dumke, R.
2012Triggering voltage for post-breakdown random telegraph noise in HfLaO dielectric metal gate metal-oxide-semiconductor field effect transistors and its reliability implicationsLiu, W. H.; Pey, Kin Leong; Raghavan, Nagarajan; Wu, X.; Bosman, Michel