Browsing by Author Yew, K. S.

Showing results 1 to 6 of 6
Issue DateTitleAuthor(s)
2018Argon-plasma-controlled optical reset in the SiO2/Cu filamentary resistive memory stackKawashima, T.; Yew, K. S.; Kyuno, K.; Zhou, Yu; Ang, Diing Shenp; Zhang, H. Z.
 2011Bimodal weibull distribution of metal/high-κ gate stack TDDB-insights by scanning tunneling microscopyYew, K. S.; Bersuker, G.; Ang, Diing Shenp
 2012The effect of specimen geometry on the mechanical behavior of trabecular bone specimensChou, Siaw Meng; Ang, B. L. S.; Tan, Y. J.; Ng, Y. J. P.; Ong, S. H. F.; Yap, S. Y.; Gwee, S. X.; Poh, C. L.; Yew, K. S.
2016Enhanced stability of complementary resistance switching in the TiN/HfOx/TiN resistive random access memory device via interface engineeringAng, Diing Shenp; Zhang, H. Z.; Yew, K. S.; Wang, X. P.
 2013A new method for enhancing high- k /metal-gate stack performance and reliability for high- k last integrationYew, K. S.; Tang, L. J.; Ang, Diing Shenp
2014Role of interfacial layer on complementary resistive switching in the TiN/HfOx/TiN resistive memory deviceAng, Diing Shenp; Zhang, H. Z.; Gu, C. J.; Yew, K. S.; Wang, X. P.; Lo, G. Q.