Browsing by Author Young, C. D.

Showing results 1 to 2 of 2
Issue DateTitleAuthor(s)
2013Electron trap transformation under positive-bias temperature stressingGao, Yuan; Ang, Diing Shenp; Bersuker, G.; Young, C. D.
 2012Evidence for the transformation of switching hole traps into permanent bulk traps under negative-bias temperature stressing of high-k P-MOSFETsGao, Yuan; Ang, Diing Shenp; Young, C. D.; Bersuker, G.