Browsing by Author Young, C. D.
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) | |
|---|---|---|---|
 | 2013 | Electron trap transformation under positive-bias temperature stressing | Gao, Yuan; Ang, Diing Shenp; Bersuker, G.; Young, C. D. |
| 2012 | Evidence for the transformation of switching hole traps into permanent bulk traps under negative-bias temperature stressing of high-k P-MOSFETs | Gao, Yuan; Ang, Diing Shenp; Young, C. D.; Bersuker, G. |