Browsing by Author Zhao, Ziqi

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Issue DateTitleAuthor(s)
2017A vacancy-interstitial defect pair model for positive-bias temperature stress-induced electron trapping transformation in the high-κ gate n-MOSFETGu, Chenjie; Ang, Diing Shenp; Gao, Yuan; Gu, Renyuan; Zhao, Ziqi; Zhu, Chao