Browsing by Author
Dev, Kapil
Showing results 1 to 8 of 8
| Issue Date | Title | Author(s) |
| | 2012 | Effect of residual stresses in injection molded cyclic olefin copolymer during microfabrication : hot embossing as well as thermal bonding | Jena, Rajeeb Kumar; Dev, Kapil; Yue, Chee Yoon; Asundi, Anand Krishna |
 | 2013 | An efficient non-Lambertian organic light-emitting diode using imprinted submicron-size zinc oxide pillar arrays | Liu, S. W.; Wang, J. X.; Divayana, Yoga; Dev, Kapil; Tan, Swee Tiam; Demir, Hilmi Volkan; Sun, Xiaowei |
| | 2014 | Highly Flexible, Electrically Driven, Top-Emitting, Quantum Dot Light-Emitting Stickers | Yang, Xuyong; Mutlugun, Evren; Dang, Cuong; Dev, Kapil; Gao, Yuan; Tan, Swee Tiam; Sun, Xiao Wei; Demir, Hilmi Volkan |
| | 2014 | Light extraction efficiency enhancement of colloidal quantum dot light-emitting diodes using large-scale nanopillar arrays | Mutlugun, Evren; Wang, Jianxiong; Dang, Cuong; Zhao, Yongbiao; Liu, Shuwei; Tang, Yuxin; Tan, Swee Tiam; Sun, Xiao Wei; Demir, Hilmi Volkan; Yang, Xuyong; Dev, Kapil |
| | 2011 | Mueller–Stokes polarimetric characterization of transmissive liquid crystal spatial light modulator | Dev, Kapil; Asundi, Anand Krishna |
| 2013 | Room-temperature larger-scale highly ordered nanorod imprints of ZnO film | Kyaw, Zabu; Jianxiong, Wang; Dev, Kapil; Tan, Swee Tiam; Ju, Zhengang; Zhang, Zi-Hui; Ji, Yun; Hasanov, Namig; Liu, Wei; Sun, Xiao Wei; Demir, Hilmi Volkan |
| 2016 | Subwavelength metrology of Al wire grating employing finite difference time domain method and Mueller matrix polarimeter | Adhikari, Achyut; Dev, Kapil; Asundi, Anand |
| 2017 | Surface roughness measurement of additive manufactured samples using angular speckle correlation | Dev, Kapil; A. S., Guru Prasad; H, Aswin; P, Prabhathan; Chan, Kelvin H. K.; Matham, Murukeshan Vadakke |
