Academic Profile : Faculty
Assoc Prof Tuan TRAN
Associate Professor, School of Mechanical & Aerospace Engineering
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Dr. Tran joined the Division of Thermal and Fluids Engineering on 31 July 2013 as a Nanyang Assistant Professor. He received his BSc degree in Engineering Mechanics from the Hanoi University of Science, Vietnam in 2004. He then pursued his graduate study which focused on thin-film flows and turbulent frictional drag at the University of Illinois at Urbana-Champaign, USA. Upon completion of his PhD degree in 2010, he worked at the Physics of Fluids Group at the University of Twente, The Netherlands, as a post-doctoral researcher.
* Physics of complex fluids
* Drop-surface interactions
* Thermal management
* 3D & Electronic printing
* Drop-surface interactions
* Thermal management
* 3D & Electronic printing
- Development of An Intelligent Monitoring System for Real-Time Quality Control in Wire Arc Additive Manufacturing
- NAMIC Phase 2 :NTU Project 2
- Optimization of a Novel Heart Valve Design for Paediatric Cardiac Surgery
US 2022/0373322 A1: Surface Profile Inspection Methods And Systems (2024)
Abstract: A surface profile inspection method and a surface profile inspection system are provided. The surface profile inspection method includes capturing a plurality of interferograms of a surface profile depicting interference between a specimen beam reflected from a surface having the surface profile and a modulated reference beam, wherein each of the plurality of interferograms corresponds to a phase of modulation of the modulated reference beam; extracting pixel values of the plurality of interferograms; calculating phase information of each of the plurality of interferograms based on the extracted pixel values, the phase information of each of the plurality of interferograms related to the phase of modulation of the modulated reference beam at a time the interferogram was captured; and reconstructing the surface profile based on the calculated phase information.
Abstract: A surface profile inspection method and a surface profile inspection system are provided. The surface profile inspection method includes capturing a plurality of interferograms of a surface profile depicting interference between a specimen beam reflected from a surface having the surface profile and a modulated reference beam, wherein each of the plurality of interferograms corresponds to a phase of modulation of the modulated reference beam; extracting pixel values of the plurality of interferograms; calculating phase information of each of the plurality of interferograms based on the extracted pixel values, the phase information of each of the plurality of interferograms related to the phase of modulation of the modulated reference beam at a time the interferogram was captured; and reconstructing the surface profile based on the calculated phase information.