Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96103
Title: On-line digital holographic measurement of size and shape of microparticles for crystallization processes
Authors: Naughton, Thomas J.
Khanam, Taslima
Darakis, Emmanouil
Rajendran, Arvind
Kariwala, Vinay
Asundi, Anand Krishna
Keywords: DRNTU::Science::Chemistry::Crystallography
Issue Date: 2008
Source: Khanam, T., Darakis, E., Rajendran, A., Kariwala, V., Asundi, A. K., & Naughton, T. J. (2008). On-line digital holographic measurement of size and shape of microparticles for crystallization processes. Proceedings of SPIE-Ninth International Symposium on Laser Metrology, 7155.
Abstract: Crystallization is a widely used chemical process that finds applications in pharmaceutical industries. In an industrial crystallization process, it is not only important to produce pure crystals but also to control the shape and size of the crystals, as they affect the efficiency of downstream processes and the dissolution property of the drug. The effectiveness of control algorithms depend on the availability of on-line, real-time information about these critical properties. In this paper, we investigate the use of lens-less in-line digital holographic microscopy for size and shape measurements for crystallization processes. For this purpose, we use non-crystalline spherical microparticles and carbon fibers with known sizes present in a liquid suspension as test systems. We propose an algorithm to extract size and shape information for a population of microparticles from the experimentally recorded digital holograms. The measurements obtained from the proposed method show good agreement with the corresponding known size and shape of the particles.
URI: https://hdl.handle.net/10356/96103
http://hdl.handle.net/10220/10076
DOI: http://dx.doi.org/10.1117/12.814557
Rights: © 2008 SPIE--The International Society for Optical Engineering. This paper was published in Proceedings of SPIE-Ninth International Symposium on Laser Metrology and is made available as an electronic reprint (preprint) with permission of SPIE--The International Society for Optical Engineering. The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.814557].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
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