Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96102
Title: Processing of digital holograms for size measurements of microparticlese
Authors: Naughton, Thomas J.
Darakis, Emmanouil
Khanam, Taslima
Rajendran, Arvind
Kariwala, Vinay
Asundi, Anand Krishna
Issue Date: 2008
Source: Darakis, E., Khanam, T., Rajendran, A., Kariwala, V., Asundi, A. K., & Naughton, T. J. (2008). Processing of digital holograms for size measurements of microparticlese. Proceedings of SPIE-Ninth International Symposium on Laser Metrology, 7155.
Abstract: Digital holography has been reported as an effective tool for particle analysis. Other image-based techniques have small depth of focus allowing only 2D analysis at microscopic level. On the other hand, digital holography offers the ability to study volume samples from a single recording as reconstructions at different depths can be obtained. This paper focuses on the processing of the digital hologram that follows its recording in order to obtain particle size. We present a stepwise processing procedure with discussion on aspects such as reconstruction, background correction, segmentation, focusing, magnification and particles' feature extraction. Solutions to common obstacles faced during particle analysis which include ways to obtain fixed size reconstructions, automatically determine the threshold value, calculate magnification, and locate particles' depth position using effective focusing metrics are highlighted. Real holograms of microparticles are used to illustrate and explain the different stages of the procedure. Experimental results show that the proposed algorithm can effectively extract particle size information from recorded digital holograms.
URI: https://hdl.handle.net/10356/96102
http://hdl.handle.net/10220/10079
DOI: http://dx.doi.org/10.1117/12.814578
Rights: © 2008 SPIE--The International Society for Optical Engineering. This paper was published in Proceedings of SPIE-Ninth International Symposium on Laser Metrology and is made available as an electronic reprint (preprint) with permission of SPIE--The International Society for Optical Engineering. The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.814578].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Conference Papers
SCBE Conference Papers

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