dc.contributor.authorZhang, Yanbing
dc.contributor.authorMei, Ting
dc.contributor.authorZhang, Dao Hua
dc.date.accessioned2013-06-10T03:21:40Z
dc.date.available2013-06-10T03:21:40Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationZhang, Y., Mei, T., & Zhang, D. H. (2012). Temporal coupled-mode theory of ring–bus–ring Mach–Zehnder interferometer. Applied Optics, 51(4), 504-508.en_US
dc.identifier.urihttp://hdl.handle.net/10220/10095
dc.description.abstractThe temporal coupled-mode theory (TCMT) for a ring–bus–ring Mach–Zehnder interferometer device is developed by taking energy conservation into account. The intercavity interaction in the device is facilitated via a tricoupler, which makes the decay of modes quantitatively different from that in other existing resonator schemes. The TCMT is related to the transfer matrix formalism with energy conservation and the Q factor, and it predicts results in good agreement with the experimental results. The mode analysis from the TCMT is quite illustrative because it can mimic the transparency as an electromagnetically induced transparency expression. The analysis of the tricoupler is applicable for analyzing the transparent resonance in two other similar configurations.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesApplied opticsen_US
dc.rights© 2012 Optical Society of America. This paper was published in Applied Optics and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: [http://dx.doi.org/10.1364/AO.51.000504].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.titleTemporal coupled-mode theory of ring–bus–ring Mach–Zehnder interferometeren_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1364/AO.51.000504
dc.description.versionPublished versionen_US


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