dc.contributor.authorSun, Sheng
dc.contributor.authorAng, Ricky Lay Kee
dc.date.accessioned2013-06-12T02:00:00Z
dc.date.available2013-06-12T02:00:00Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationSun, S., & Ang, L. K. R. (2012). Onset of space charge limited current for field emission from a single sharp tip. Physics of plasmas, 19(3).en_US
dc.identifier.issn1070-664Xen_US
dc.identifier.urihttp://hdl.handle.net/10220/10216
dc.description.abstractA protrusive model of the Child-Langmuir (CL) law is proposed for non-uniform electron field emission from a sharp tip of either Lorentzian or hyperboloid shape. The model is expressed as Jc = μ×J1D at large electric field higher than a critical value Ec, and J1D is the classical one-dimensional CL law. It is found that the enhancement μ over the 1D CL law depends only on the calculated field enhancement factor (β) of the emitter and is independent of the work function and gap spacing. In particular, μ increases with β and it converges to a constant at β≫ 1 for a very sharp tip with small emission area.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesPhysics of plasmasen_US
dc.rights© 2012 American Institute of Physics. This paper was published in Physics of Plasmas and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3695090]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleOnset of space charge limited current for field emission from a single sharp tipen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.3695090
dc.description.versionPublished versionen_US


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