dc.contributor.authorDong, Xiaochen
dc.contributor.authorLong, Qing
dc.contributor.authorWei, Ang
dc.contributor.authorZhang, Wenjing
dc.contributor.authorLi, Lain-Jong
dc.contributor.authorChen, Peng
dc.contributor.authorHuang, Wei
dc.date.accessioned2013-06-28T01:15:36Z
dc.date.available2013-06-28T01:15:36Z
dc.date.copyright2011en_US
dc.date.issued2011
dc.identifier.citationDong, X., Long, Q., Wei, A., Zhang, W., Li, L. J., Chen, P., et al. (2011). The electrical properties of graphene modified by bromophenyl groups derived from a diazonium compound. Carbon, 50(4), 1517-1522.en_US
dc.identifier.issn0008-6223en_US
dc.identifier.urihttp://hdl.handle.net/10220/10818
dc.description.abstractGraphene field-effect transistors were fabricated with mechanically exfoliated single-layer graphene (SLG) and bilayer graphene (BLG) sheets and the functionalization effects of bromophenyl groups derived from a diazonium compound on its transfer properties were explored. Spectroscopic and electrical studies reveal that the bromophenyl grafting imposes p-doping to both SLG and BLG. The modification of SLG by bromophenyl groups significantly reduces the hole carrier mobility and the saturation current in SLG transistors, suggesting an increase in both long-range impurity and short-range defect scattering. Unexpectedly, the bromophenyl group functionalization on BLG does not obviously increase both types of scattering, indicating that the BLG is relatively more resistant to charge- or defect-induced scattering. The results indicate that chemical modification is a simple approach to tailor the electrical properties of graphene sheets with different numbers of layers.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesCarbonen_US
dc.rights© 2011 Elsevier Ltd.en_US
dc.subjectDRNTU::Engineering::Bioengineering
dc.titleThe electrical properties of graphene modified by bromophenyl groups derived from a diazonium compounden_US
dc.typeJournal Article
dc.contributor.schoolSchool of Chemical and Biomedical Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1016/j.carbon.2011.11.029


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