Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/98976
Title: Enhancing photocurrent transient spectroscopy by electromagnetic modeling
Authors: Diesinger, H.
Panahandeh-Fard, Majid
Wang, Z.
Baillargeat, Dominique
Soci, Cesare
Issue Date: 2012
Source: Diesinger, H., Panahandeh-Fard, M., Wang, Z., Baillargeat, D., & Soci, C. (2012). Enhancing photocurrent transient spectroscopy by electromagnetic modeling. Review of Scientific Instruments, 83, 053103.
Series/Report no.: Review of scientific instruments
Abstract: The shape and duration of photocurrent transients generated by a photoconductive switch depend on both the intrinsic response of the active material and the geometry of the transmission line structure. The present electromagnetic model decouples both shape forming contributions. In contrast to previously published work, it accounts for the particular operating mode of transient spectroscopy. The objective is to increase the time resolution by two approaches, by optimizing structural response and by deconvolving it from experimental data. The switch structure is represented by an effective transimpedance onto which the active material acts as current generator. As proof of concept, the response of a standard microstrip switch is modeled and deconvolved from experimental data acquired in GaAs, yielding a single exponential material response and hence supporting the validity of the approach. Beyond compensating for the response deterioration by the structure, switch architectures can be a priori optimized with respect to frequency response. As an example, it is shown that a microstrip gap that can be deposited on materials incompatible with standard lithography reduces pulse broadening by an order of magnitude if it is provided with transitions to coplanar access lines.
URI: https://hdl.handle.net/10356/98976
http://hdl.handle.net/10220/10916
ISSN: 0034-6748
DOI: http://dx.doi.org/10.1063/1.4710996
Rights: © 2012 American Institute of Physics. This paper was published in Review of Scientific Instruments and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.4710996]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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