Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/102371
Title: Reliability study of LED driver – a case study of black box testing
Authors: Lan, Song
Tan, Cher Ming
Wu, Kevin
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2012
Source: Lan, S., Tan, C. M., Wu, K. (2012). Reliability study of LED driver – a case study of black box testing. Microelectronics Reliability, 52(9-10), 1940-1944.
Series/Report no.: Microelectronics reliability
Abstract: A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability study of a commercial LED driver and the circuit degradation model is built. The possible failure mechanisms of the LED driver are proposed and verified through failure analysis.
URI: https://hdl.handle.net/10356/102371
http://hdl.handle.net/10220/11192
DOI: 10.1016/j.microrel.2012.06.023
Rights: © 2012 Elsevier Ltd.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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