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|Title:||Reliability study of LED driver – a case study of black box testing||Authors:||Lan, Song
Tan, Cher Ming
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2012||Source:||Lan, S., Tan, C. M., Wu, K. (2012). Reliability study of LED driver – a case study of black box testing. Microelectronics Reliability, 52(9-10), 1940-1944.||Series/Report no.:||Microelectronics reliability||Abstract:||A method to evaluate the reliability of the Integrated Circuit without knowing the details of the internal circuit is developed. This method is called Pseudo Black Box testing because the basic knowledge of circuit theory is needed. In this paper, this black box testing is applied to the reliability study of a commercial LED driver and the circuit degradation model is built. The possible failure mechanisms of the LED driver are proposed and verified through failure analysis.||URI:||https://hdl.handle.net/10356/102371
|DOI:||10.1016/j.microrel.2012.06.023||Rights:||© 2012 Elsevier Ltd.||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||EEE Journal Articles|
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