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Title: Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test
Authors: Chen, Sihan Joseph
Tan, Cher Ming
Chen, Eric Boon Khai
Chua, Shaun Zhi Yong
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Issue Date: 2011
Series/Report no.: Microelectronics reliability
Abstract: In order to accurately estimate the lifetime of Light Emitting Diodes (LEDs), accelerated stress tests have to be performed, and measurements done throughout the tests should be free of artifact and repeatable to ensure accurate observations of the degradation of the LEDs. In this work, measurements artifact arising from DC biasing and PWM settings were first presented. Electrical measurements consistency was then studied. Optimized setting for accurate measurement is obtained using Response Surface Method with Central Composite Design, and the setting is verified through experiments.
DOI: 10.1016/j.microrel.2011.08.020
Rights: © 2011 Elsevier Ltd.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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