Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96182
Title: Temperature-dependent terahertz conductivity of tin oxide nanowire films
Authors: Zou, Xingquan
Luo, Jingshan
Lee, Dongwook
Cheng, Chuanwei
Springer, Daniel
Cheong, Siew Ann
Fan, Hong Jin
Nair, Saritha K.
Chia, Elbert E. M.
Issue Date: 2012
Source: Zou, X., Luo, J., Lee, D., Cheng, C., Springer, D., Nair, S. K., Cheong, S. A., Fan, H. J., & Chia, E. E. M. (2012). Temperature-dependent terahertz conductivity of tin oxide nanowire films. Journal of Physics D: Applied Physics, 45(46), 465101.
Series/Report no.: Journal of physics D : applied physics
Abstract: Temperature-dependent terahertz conductivity of tin oxide (SnO2) nanowire films was measured from 10 to 300 K using terahertz time-domain spectroscopy. The optical parameters, including the complex refractive index, optical conductivity and dielectric function, were obtained using a simple effective medium theory. The complex conductivity was fitted with the Drude–Smith model and the plasmon model. The results show that the carrier density (N) and plasmon resonance frequency (ω0) increase while the scattering time decreases with increasing temperature. The reduced carrier mobility compared with bulk SnO2 indicates the presence of carrier localization or trapping in these nanowires.
URI: https://hdl.handle.net/10356/96182
http://hdl.handle.net/10220/11392
DOI: http://dx.doi.org/10.1088/0022-3727/45/46/465101
Rights: © 2012 IOP Publishing Ltd.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:SPMS Journal Articles

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