Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/97437
Title: | Development of near-field emission limit from radiated-emission limit based on statistical approach | Authors: | See, Kye Yak Fang, Ning Wang, Lin Biao Soh, Wei-Shan Svimonishvili, Tengiz Oswal, Manish Chang, Weng-Yew Koh, Wee Jin |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2012 | Source: | See, K.-Y., Fang, N., Wang, L.-B., Soh, W., Svimonishvili, T., Oswal, M., et al. (2012). Development of near-field emission limit from radiated-emission limit based on statistical approach. 2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS). | Conference: | IEEE Electrical Design of Advanced Packaging and Systems Symposium (2012 : Taipei, Taiwan) | Abstract: | This paper discusses a novel approach to transforming a radiated-emission limit (e.g., CISPR 22 and FCC) from the far-field to the near-field region. The proposed approach combines data from a near-field scanner and a gigahertz transverse electromagnetic cell with statistics to establish a simple relationship between a near-field magnetic field and a far-field electric field. It is shown that the proposed approach has the potential to be a simple, quick, and fairly inexpensive tool for electromagnetic compatibility pre-compliance purposes. | URI: | https://hdl.handle.net/10356/97437 http://hdl.handle.net/10220/12006 |
DOI: | 10.1109/EDAPS.2012.6469388 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2012 IEEE. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Conference Papers |
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