dc.contributor.authorOu, Yanjing
dc.contributor.authorWu, Zhang
dc.contributor.authorLee, Ka Man
dc.contributor.authorWu, Kan
dc.date.accessioned2013-07-25T08:21:08Z
dc.date.available2013-07-25T08:21:08Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationOu, Y., Wu, Z., Lee, K. M., & Wu, K. (2012). An Adaptive CUSUM Chart with Single Sample Size for Monitoring Process Mean and Variance. Quality and Reliability Engineering International.en_US
dc.identifier.issn0748-8017en_US
dc.identifier.urihttp://hdl.handle.net/10220/12306
dc.description.abstractThis article proposes an adaptive absolute cumulative sum chart (called the adaptive ACUSUM chart) for statistical process control. The new development includes the variable sampling interval (VSI), variable sample size (VSS) and VSS and interval (VSSI) versions, all of which are highly effective for monitoring the mean and variance of a variable x by inspecting the absolute sample shift inline image (where μ0 is the in-control mean or target value of x). While the adaptive ACUSUM chart is a straightforward extension of the ABS CUSUM chart developed by Wu, et al., it is much more effective than all other adaptive CUSUM charts. Noteworthily, the superiority of VSI ACUSUM chart over the best adaptive CUSUM chart in literature is about 35% from an overall viewpoint. Moreover, the design and implementation of the adaptive ACUSUM chart are much simpler than that of all other adaptive CUSUM schemes. All these desirable features of the adaptive ACUSUM chart may be attributable to the use of a single sample size (n = 1). Another quite interesting finding is that the simpler VSI ACUSUM chart works equally well as the more complicated VSSI ACUSUM chart.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesQuality and reliability engineering internationalen_US
dc.rights© 2012 John Wiley & Sons, Ltd.en_US
dc.titleAn adaptive CUSUM chart with single sample size for monitoring process mean and varianceen_US
dc.typeJournal Article
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1002/qre.1454


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