dc.contributor.authorGallego-Jutglà, Esteve
dc.contributor.authorElgendi, Mohamed
dc.contributor.authorVialatte, François-Benoît
dc.contributor.authorSolé-Casals, Jordi
dc.contributor.authorCichocki, Andrzej
dc.contributor.authorLatchoumane, Charles
dc.contributor.authorJeong, Jaeseung
dc.contributor.authorDauwels, Justin
dc.date.accessioned2013-07-30T07:20:48Z
dc.date.available2013-07-30T07:20:48Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.urihttp://hdl.handle.net/10220/12524
dc.description.abstractSeveral clinical studies have reported that EEG synchrony is affected by Alzheimer's disease (AD). In this paper a frequency band analysis of AD EEG signals is presented, with the aim of improving the diagnosis of AD using EEG signals. In this paper, multiple synchrony measures are assessed through statistical tests (Mann-Whitney U test), including correlation, phase synchrony and Granger causality measures. Moreover, linear discriminant analysis (LDA) is conducted with those synchrony measures as features. For the data set at hand, the frequency range (5-6Hz) yields the best accuracy for diagnosing AD, which lies within the classical theta band (4-8Hz). The corresponding classification error is 4.88% for directed transfer function (DTF) Granger causality measure. Interestingly, results show that EEG of AD patients is more synchronous than in healthy subjects within the optimized range 5-6Hz, which is in sharp contrast with the loss of synchrony in AD EEG reported in many earlier studies. This new finding may provide new insights about the neurophysiology of AD. Additional testing on larger AD datasets is required to verify the effectiveness of the proposed approach.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Electrical and electronic engineering
dc.titleDiagnosis of Alzheimer's disease from EEG by means of synchrony measures in optimized frequency bandsen_US
dc.typeConference Paper
dc.contributor.conferenceAnnual International Conference of the IEEE Engineering in Medicine and Biology Society (34th : 2012 : San Diego, USA)en_US
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1109/EMBC.2012.6346909


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