dc.contributor.authorChuang, Yi-Chen
dc.contributor.authorDudley, Richard
dc.contributor.authorFiddy, Michael A.
dc.date.accessioned2013-08-01T01:51:16Z
dc.date.available2013-08-01T01:51:16Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationChuang, Y. C., Dudley, R., & Fiddy, M. A. (2012). Compressive sampling methods for superresolution imaging. Proceedings of SPIE - Image Reconstruction from Incomplete Data VII, 850005.en_US
dc.identifier.urihttp://hdl.handle.net/10220/12695
dc.description.abstractWe investigate superresolution imaging using negative index metamaterials. Measurement of subwavelength scale features in the image domain is tedious and compressive sampling techniques are considered to alleviate this problem. A single detector (c.f. a single pixel camera geometry) is considered from which a high resolution image can be computed, which makes use of structured illumination for coding.en_US
dc.language.isoenen_US
dc.rights© 2012 SPIE. This paper was published in Proceedings of SPIE - Image Reconstruction from Incomplete Data VII and is made available as an electronic reprint (preprint) with permission of SPIE. The paper can be found at the following official DOI: [http://dx.doi.org/10.1117/12.930837]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
dc.titleCompressive sampling methods for superresolution imagingen_US
dc.typeConference Paper
dc.contributor.conferenceImage Reconstruction from Incomplete Data (7th : 2012 : San Diego, US)*
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen_US
dc.identifier.doihttp://dx.doi.org/10.1117/12.930837
dc.description.versionPublished version


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