dc.contributor.authorTang, Chaoying
dc.contributor.authorZhang, Hengyi
dc.contributor.authorKong, A. W.
dc.contributor.authorCraft, Noah
dc.date.accessioned2013-08-02T03:16:50Z
dc.date.available2013-08-02T03:16:50Z
dc.date.copyright2012en_US
dc.date.issued2012
dc.identifier.citationTang, C., Zhang, H., Kong, A. W., & Craft, N. (2012). Visualizing vein patterns from color skin images based on image mapping for forensics analysis. Proceedings - International Conference on Pattern Recognition, 2387-2390.en_US
dc.identifier.urihttp://hdl.handle.net/10220/12843
dc.description.abstractTraditionally, it was difficult to use vein patterns in evidence images for forensic identification, because they were nearly invisible in color images. We proposed a computational method based on skin optics to uncover vein patterns from color images. However, its performance is dependent on the accuracy of the skin optical model. In this paper, we propose an algorithm based on image mapping to visualize vein patterns. It extracts information from a pair of synchronized color and near infrared (NIR) images, and uses a neural network (NN) to map RGB values to NIR intensities. In addition, an NN weight adjustment scheme is proposed to improve the robustness of the algorithm. The proposed algorithm was examined on a database with 300 pairs of color and NIR images collected from the forearms of 150 subjects. The automatic matching results from the proposed algorithm were better than those from our previous method, and comparable to the results from matching NIR images with NIR images.en_US
dc.language.isoenen_US
dc.subjectDRNTU::Engineering::Computer science and engineering
dc.titleVisualizing vein patterns from color skin images based on image mapping for forensics analysis.en_US
dc.typeConference Paper
dc.contributor.conferenceInternational Conference on Pattern Recognition (21st : 2012 : Tsukuba, Japan)en_US
dc.contributor.schoolSchool of Computer Engineeringen_US
dc.identifier.openurlhttp://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6460646&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6460646


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